VERT Forum & Focus Day 2026
On 19–20 March 2026, the VERT Forum and Focus Day took place at the Federal Institute of Metrology (METAS) in Bern, Switzerland, bringing together experts from industry, research institutions, testing organisations and regulatory authorities to discuss developments in vehicle emissions control, ultrafine particle measurement and air quality technologies.
The event focused on the latest scientific and technical advances in the measurement and mitigation of ultrafine particle emissions, as well as on the implementation and further development of Particle Number – Periodic Technical Inspection (PN-PTI) systems. PN-PTI continues to demonstrate its effectiveness in identifying high-emitting vehicles and ensuring the proper functioning of emission control systems. The discussions highlighted the importance of continuing the international harmonisation and further development of PN-PTI as part of broader strategies to improve air quality and reduce vehicle emissions.


The first day of the forum addressed nanoparticle pollution and indoor air quality, including new approaches to mitigation through advanced filtration technologies, nanoparticle metrology and innovative air quality solutions.
The Focus Day on 20 March concentrated on the implementation of NPTI worldwide, presenting experiences from early-adopter countries and discussing future developments, including potential expansion to petrol engines and other combustion engine applications.
CITA was strongly represented at the event, with many CITA members participating in the discussions and technical sessions. CITA itself was represented by Alejandro Checa, Technical Director, and Pascal Buekenhoudt, Vice-President Technical Affairs. During the Focus Day, Mr. Checa presented on the evolution of pollution control within PTI, highlighting its role in ensuring the environmental performance of vehicles throughout their lifetime and discussing future inspection approaches, including particle number measurement and digital inspection technologies.
